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DeCS
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Descriptor English:
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Microscopy, Electron
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Descriptor Spanish:
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microscopía electrónica
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Descriptor Portuguese:
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Microscopia Eletrônica
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Synonyms English:
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Electron Microscopy
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Tree Number:
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E01.370.350.515.402
E05.595.402
SP4.006.057.488.724
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Definition English:
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Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen. |
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Indexing Annotation English:
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GEN: prefer specifics; relation to /ultrastruct: Manual 26.12.1
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Allowable Qualifiers English:
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Record Number:
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23315
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Unique Identifier:
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D008854
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Occurrence in VHL:
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Similar:
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DeCS
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